Cover of Defect and Microstructure Analysis by Diffraction by Snyder, R. L., Bunge, Hans J., Bunge, H. -J, ISBN 9780198501893
Analytic

Defect and Microstructure Analysis by Diffraction

DEFECT & MICROSTRUCTURE ANALYS

Contributor(s): Author , Author , Author Format: Hardback

Hardback ยท ISBN 9780198501893

โ‚น50,568

Inclusive of GST and other taxes

100% Quality Assurance
No Account Creation Required
Fast Delivery
Secured Transactions

Arriving at your doorstep in 10-15 days

Our logisitcs team will make sure everyitem is delivered safely

Key Specifications

ISBN 9780198501893
Subtitle DEFECT & MICROSTRUCTURE ANALYS
Publisher OUP Oxford
Publication date January 2000
Language English
MRP ยฃ360.00 GBP
Page count 808
Item weight 286 g

Defect and Microstructure Analysis by Diffraction published by OUP Oxford.