Circuits

Guidebook for Managing Silicon Chip Reliability

Name: Guidebook for Managing Silicon Chip Reliability
Brand: CRC Press
SKU: 9780367400064
Price: 6179.00 INR
Availability: InStock
ISBN: 9780367400064

Contributor(s): Pecht, Michael Author , Radojcic, Riko Author , Rao, Gopal Author Format: Paperback

Paperback · ISBN 9780367400064

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Key Specifications

ISBN	9780367400064
Publisher	CRC Press
Publication date	October 2019
Language	English
MRP	£43.99 GBP
Page count	226
Item weight	72 g

Achieving cost-effective performance over time requires an organized, disciplined, and time-phased approach to product design, development, qualification, manufacture, and in-service management. Guidebook for Managing Silicon Chip Reliability examines the principal failure mechanisms associated with modern integrated circuits and describes common practices used to resolve them.

This quick reference on semiconductor reliability addresses the key question: How will the understanding of failure mechanisms affect the future?

Chapters discuss:

failure sites, operational loads, and failure mechanism

intrinsic device sensitivities

electromigration

hot carrier aging

time dependent dielectric breakdown

mechanical stress induced migration

alpha particle sensitivity

electrostatic discharge (ESD) and electrical overstress

latch-up

qualification

screening

guidelines for designing reliability

Guidebook for Managing Silicon Chip Reliability focuses on device failure and causes throughout - providing a thorough framework on how to model the mechanism, test for defects, and avoid and manage damage. It will serve as an exceptional resource for electrical engineers as well as mechanical engineers working in the field of electronic packaging.

Guidebook for Managing Silicon Chip Reliability

Key Specifications

Pecht, Michael Author

Radojcic, Riko Author

Rao, Gopal Author

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