$Cover of High Resolution X-Ray Diffractometry And Topography by Bowen, D.K., Tanner, Brian K., ISBN 9780367400637$

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High Resolution X-Ray Diffractometry And Topography

Name: High Resolution X-Ray Diffractometry And Topography
Brand: CRC Press
SKU: 9780367400637
Price: 10253.00 INR
Availability: InStock
ISBN: 9780367400637

Contributor(s): Bowen, D.K. Author , Tanner, Brian K. Author Format: Paperback

Paperback · ISBN 9780367400637

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Key Specifications

ISBN	9780367400637
Publisher	CRC Press
Publication date	October 2019
Language	English
MRP	£72.99 GBP
Page count	264
Item weight	97 g

The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization.

High Resolution X-Ray Diffractometry And Topography

Key Specifications

Bowen, D.K. Author

Tanner, Brian K. Author

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