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Reflection Electron Microscopy and Spectroscopy for Surface Analysis

Name: Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Brand: Cambridge University Press
SKU: 9780521017954
Price: 7521.00 INR
Availability: InStock
ISBN: 9780521017954

REFLECTION ELECTRON MICROSCOPY

Contributor(s): Wang, Zhong , Lin Author , Zhong-Lin Wang Author Format: Paperback

Paperback · ISBN 9780521017954

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Key Specifications

ISBN	9780521017954
Subtitle	REFLECTION ELECTRON MICROSCOPY
Publisher	Cambridge University Press
Publication date	August 2005
Language	English
MRP	£53.00 GBP
Page count	460
Item weight	161 g

This book is a comprehensive review of the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS). The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy-loss spectra in different scattering geometries. This and many other features makes the book an important and timely addition to the materials science literature for researchers and graduate students in physics and materials science.

Reflection Electron Microscopy and Spectroscopy for Surface Analysis

Key Specifications

Wang, Zhong , Lin Author

Zhong-Lin Wang Author

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