Cover of Semiconductor Memories: Technology, Testing, and Reliability by Sharma, Ashok K., IEEE, Sharma, MD Facp Facc, ISBN 9780780310001
Electrical

Semiconductor Memories: Technology, Testing, and Reliability

SEMICONDUCTOR MEMORIES

Contributor(s): Author , Author , Author Format: Hardback

Hardback ยท ISBN 9780780310001

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Key Specifications

ISBN 9780780310001
Subtitle SEMICONDUCTOR MEMORIES
Publisher John Wiley & Sons
Publication date August 2002
Language English
MRP ยฃ185.95 GBP
Page count 476
Item weight 229 g
Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.