Cover of High Resolution X-Ray Diffractometry And Topography by Bowen, D.K., Tanner, Brian K., ISBN 9780850667585
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High Resolution X-Ray Diffractometry And Topography

HIGH RESOLUTION X-RAY DIFFRACT

Contributor(s): Author , Author Format: Hardback

Hardback · ISBN 9780850667585

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Key Specifications

ISBN 9780850667585
Subtitle HIGH RESOLUTION X-RAY DIFFRACT
Publisher CRC Press
Publication date February 1998
Language English
MRP £210.00 GBP
Page count 264
Item weight 121 g

High Resolution X-Ray Diffractometry And Topography published by CRC Press.