Cover of Testing Static Random Access Memories : Defects, Fault Models and Test Patterns by Hamdioui, Said, ISBN 9781402077524
Electrical

Testing Static Random Access Memories : Defects, Fault Models and Test Patterns

TESTING STATIC RANDOM ACCESS M

Contributor(s): Author Format: Hardback

Hardback · ISBN 9781402077524

₹12,770

Inclusive of GST and other taxes

100% Quality Assurance
No Account Creation Required
Fast Delivery
Secured Transactions

Arriving at your doorstep in 10-15 days

Our logisitcs team will make sure everyitem is delivered safely

Key Specifications

ISBN 9781402077524
Subtitle TESTING STATIC RANDOM ACCESS M
Publisher Springer
Publication date March 2004
Language English
MRP £89.99 GBP
Page count 244
Item weight 115 g

Testing Static Random Access Memories : Defects, Fault Models and Test Patterns published by Springer.