Cover of Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces by Walkosz, Weronika, ISBN 9781441978165
Atomic & Molecular

Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces

ATOMIC SCALE CHARACTERIZATION

Contributor(s): Author Format: Hardback

Hardback Β· ISBN 9781441978165

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Key Specifications

ISBN 9781441978165
Subtitle ATOMIC SCALE CHARACTERIZATION
Publisher Springer
Publication date April 2011
Language English
MRP Β£89.99 GBP
Page count 124
Item weight 78 g

Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces published by Springer.