Cover of Spatial Point Patterns: Methodology and Applications with R by Baddeley, Adrian, Rubak, Ege, Turner, Rolf, ISBN 9781482210200
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Spatial Point Patterns: Methodology and Applications with R

Contributor(s): Author , Author , Author Format: Hardback

Hardback Β· ISBN 9781482210200

β‚Ή17,557

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Key Specifications

ISBN 9781482210200
Publisher Chapman and Hall/CRC
Publication date November 2015
Language English
MRP Β£124.99 GBP
Page count 830
Item weight 362 g

Spatial Point Patterns: Methodology and Applications with R published by Chapman and Hall/CRC.