Cover of CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability             Implications by Demkov, Alexander A., Taylor, Bill, Harris, H. Rusty, ISBN 9781605111285
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CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications

Contributor(s): Editor , Editor , Editor Format: Hardback

Hardback ยท ISBN 9781605111285

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Key Specifications

ISBN 9781605111285
Publisher Cambridge University Press
Publication date November 2009
Language English
MRP ยฃ99.00 GBP
Page count 194
Item weight 95 g

CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications published by Cambridge University Press.