Cover of Electromigration Inside Logic Cells : Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS by Posser, Gracieli, Sapatnekar, Sachin S., Reis, Ricardo, ISBN 9783319840413
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Electromigration Inside Logic Cells : Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS

Contributor(s): Author , Author , Author Format: Paperback

Paperback Β· ISBN 9783319840413

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Key Specifications

ISBN 9783319840413
Publisher Springer
Publication date July 2018
Language English
MRP Β£44.99 GBP
Page count 140
Item weight 46 g

Electromigration Inside Logic Cells : Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS published by Springer.