Cover of Hybrid Code-Based Test Data Compression and Decompression for VLSI Circuits by Chinnappa Gounder, Kalamani, ISBN 9783668737501
Business & Productivity Software

Hybrid Code-Based Test Data Compression and Decompression for VLSI Circuits

Contributor(s): Author Format: Paperback

Paperback Β· ISBN 9783668737501

β‚Ή7,785 3%
β‚Ή7,985

Inclusive of GST and other taxes

100% Quality Assurance
No Account Creation Required
Fast Delivery
Secured Transactions

Arriving at your doorstep in 10-15 days

Our logisitcs team will make sure everyitem is delivered safely

Key Specifications

ISBN 9783668737501
Publisher GRIN Verlag
Publication date July 2018
Language English
MRP Β£61.90 GBP
Page count 218
Item weight 64 g

Hybrid Code-Based Test Data Compression and Decompression for VLSI Circuits published by GRIN Verlag.