Cover of Electromigration Modeling at Circuit Layout Level by Tan, Cher Ming, He, Feifei, ISBN 9789814451208
Atomic & Molecular

Electromigration Modeling at Circuit Layout Level

ELECTROMIGRATION MODELING AT C

Contributor(s): Author , Author Format: Paperback

Paperback ยท ISBN 9789814451208

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Key Specifications

ISBN 9789814451208
Subtitle ELECTROMIGRATION MODELING AT C
Publisher Springer
Publication date May 2013
Language English
MRP ยฃ44.99 GBP
Page count 116
Item weight 39 g

Electromigration Modeling at Circuit Layout Level published by Springer.